HD 138 S2:1990

Sealing test for pressurized waveguide tubing and assemblies

Specifies uniform measuring methods for sealing tests for pressurized waveguide components and assemblies. These measuring methods are carried out with regard to quantity and quality.

Dichtheitsprüfung für druckdichte Hohlleiterrohre und -Anordnungen

Essai d'étanchéité applicable aux guides d'ondes soumis à la pression et à leurs dispositifs d'assemblage

Spécifie des méthodes de mesure uniformes pour les essais d'étanchéité des composants et assemblages de guides d'ondes à surpression interne. Ces méthodes de mesure sont mises en oeuvre tant sur le plan quantitatif que sur le plan qualitatif.

Sealing test for pressurized waveguide tibing and assemblies

General Information

• Status: Published
• Publication Date: 22-Jul-1990
• Withdrawal Date: 14-Jun-1991
• Technical Committee: CLC/SR 46F - RF and microwave passive components
• Drafting Committee: IEC/SC 46F - IEC_SC_46F
• Parallel Committee: IEC/SC 46F - IEC_SC_46F
• Current Stage: 6060 - Document made available - Publishing
• Completion Date: 23-Jul-1990
• Ref Project: SIST HD 138 S2:2002 - Sealing test for pressurized waveguide tubing and assemblies

Standards Content (Sample)

SLOVENSKI SIST HD 138 S2:2002
prva izdaja
STANDARD
september 2002
Sealing test for pressurized waveguide tibing and assemblies
ICS 33.120.10 Referenčna številka
SIST HD 138 S2:2002(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

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NORME
CEI
INTERNATIONALE
IEC
60261
INTERNATIONAL
Deuxième édition
STANDARD
Second edition
1989-01
Essai d'étanchéité applicable aux guides
d'ondes soumis à la pression et à leurs
dispositifs d'assemblage
Sealing test for pressurized waveguide
tubing and assemblies
© IEC 1989 Droits de reproduction réservés — Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun any form or by any means, electronic or mechanical,
procédé, électronique ou mécanique : y compris la photo- including photocopying and microfilm, without permission in
copie et les microfilms, sans l'accord écrit de l'éditeur. writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: [phone] e-mail: [e-mail] IEC web site http: //www.iec.ch
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PRICE CODE
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IEC
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Pour prix, voir catalogue en vigueur
• • For price, see current catalogue

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261 ©IEC — 3 —
CONTENTS
Page
FOREWORD 5
5
PREFACE
Clause
7
1. Scope
2. Units 7
Test method A: Pressure drop during elapsed time (quantity test) 7
3.
3.1 Definitions of terms and symbols 7
9
3.2 Test procedure
11
3.3 Preferred test conditions
11
3.4 Summary of details which may need to be specified in the relevant specification
4. Test method B: Leak rate 11
4.1 Definition, units of terms and symbols 11
11
4.2 Test apparatus
13
4.3 Test procedure
4.4 Summary of details which may need to be specified in the relevant specification 13
4.5 Preferred test conditions 13
5. Test method C: Bubble test (quality test) 13
13
5.1 Test procedure
15
5.2 Preferred test conditions
Summary of details which may need to be specified in the relevant specification 15
5.3
6. Test method D: Halogen leakage test (quality test) 15
17
7. Test method E': Helium leakage test (quantity and quality test)
18
FIGURE

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261©IEC — 5 —
INTERNATIONAL ELECTROTECHNICAL COMMISSION
SEALING TEST FOR PRESSURIZED WAVEGUIDE TUBING
AND ASSEMBLIES
FOREWORD
1)
The formal decisions or agreements of the I EC on technical matters, prepared by Technical Committees on which all the National
Committees having a special interest therein are represented, express, as nearly as possible, an inte
rnational consensus of opinion
on the subjects dealt with.
2)
They have the form of recommendations for inte rn
ational use and they are accepted by the National Committees in that
sense.
3) In order to promote intern
ational unification, the I EC expresses the wish that all National Committees should adopt the text of
the I EC recommendation for their national rules in so far as national conditions will permit. Any divergence between the I E C
recommendation and the corresponding national rules should, as far as possible, be clearly indicated in the latter.
PREFACE
This standard has been prepared by Sub-Committee 46B: Waveguides and their accessories, of I EC
Technical Committee No. 46: Cables, wires, and waveguides for telecommunication equipment.
This second edition of IEC Publication 261 replaces the first edition issued in 1968.
The text of this standard is based on the following documents:
Six Months' Rule
Report on Voting
46B(CO)104 46B(CO)107
Full information on the voting for the approval of this standard can be found in the Voting Repo
rt
indicated in the above table.
The following /EC publications are quoted in this standard:
Publications Nos. 68-1 (1988): Environmental testing, Pa rt 1: General and Guidance.
68-2-17 (1978): Pa rt 2: Tests — Test Q: Sealing.

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— 7 —
261®IEC
SEALING TEST FOR PRESSURIZED WAVEGUIDE TUBING
AND ASSEMBLIES
1. Scope
This standard specifies uniform measuring methods for sealing tests for pressurized waveguide
components and assemblies. These measuring methods are carried out with regard to quantity and
quality.
2. Unit of pressure
The following SI unit of pressure is used in this standard: pascal (Pa).
Notes I. — 1 bar = 105 Pa.
2. — SI unit kilopascal (kPa) be used.
For ease in mathematical calculations it is recommended that the
3. - [1 psi Ibf/in 2] = 6.895 X 10; Pa.
3. Test method A: Pressure drop during elapsed time (quantity test)
The leak rate and the rate of pressure loss from a seale
...