SIST EN IEC 60749-13:2018

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018)

This part of IEC 60749 describes a salt atmosphere test that determines the resistance of
semiconductor devices to corrosion. It is an accelerated test that simulates the effects of
severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices
specified for a marine environment.
The salt atmosphere test is considered destructive.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 13: Salzatmosphäre (IEC 60749-13:2018)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 13: Atmosphère saline (IEC 60749-13:2018)

L’IEC 60749-13:2018 décrit un essai d’atmosphère saline réalisé pour déterminer la résistance à la corrosion des dispositifs à semiconducteurs. Il s’agit d’un essai accéléré qui simule les effets d’une atmosphère côtière corrosive sur toutes les surfaces exposées. Il n’est applicable qu’aux dispositifs spécifiés pour un environnement maritime. L’essai d’atmosphère saline est considéré comme destructif.
Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a) alignement avec la norme MIL-STD-883J, Method 1009.8, Salt Atmosphere (Corrosion), y compris les informations sur le conditionnement et la maintenance de la chambre d’essai et sur le montage des spécimens d’essais (y compris les figures explicatives).

   

Polprevodniški elementi - Metode za mehansko in klimatsko preskušanje - 13. del: Solna atmosfera (IEC 60749-13:2018)

Ta del standarda IEC 60749 opisuje preskus v solni atmosferi, ki določa odpornost polprevodniških naprav proti koroziji. To je pospešeno preskušanje, ki simulira vplive hude oblike atmosfere ob morski obali na vse izpostavljene površine. Uporablja se samo za tiste elemente, ki so namenjeni uporabi v morskem okolju.
Preskus v solni atmosferi se obravnava kot porušitveni.

General Information

• Status: Published
• Publication Date: 09-May-2018
• ICS: 19.060 - Mechanical testing
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 19-Apr-2018
• Due Date: 24-Jun-2018
• Completion Date: 10-May-2018
• Ref Project: EN IEC 60749-13:2018 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Relations

• Replaces: SIST EN 60749-13:2004 - Semiconductor devices - Mechanical and climatic test methods -- Part 13: Salt atmosphere
• Effective Date: 17-Apr-2018
• Replaces: SIST EN 60749-13:2004 - Semiconductor devices - Mechanical and climatic test methods -- Part 13: Salt atmosphere
• Effective Date: 07-Jun-2022

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN IEC 60749-13:2018
01-junij-2018
1DGRPHãþD
SIST EN 60749-13:2004
Polprevodniški elementi - Metode za mehansko in klimatsko preskušanje - 13. del:
Solna atmosfera (IEC 60749-13:2018)
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt
atmosphere (IEC 60749-13:2018)
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 13:
Salzatmosphäre (IEC 60749-13:2018)
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie
13: Atmosphère saline (IEC 60749-13:2018)
Ta slovenski standard je istoveten z: EN IEC 60749-13:2018
ICS:
19.060 Mehansko preskušanje Mechanical testing
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
SIST EN IEC 60749-13:2018 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------

SIST EN IEC 60749-13:2018

---------------------- Page: 2 ----------------------

SIST EN IEC 60749-13:2018


EUROPEAN STANDARD EN IEC 60749-13

NORME EUROPÉENNE

EUROPÄISCHE NORM
April 2018
ICS 31.080.01 Supersedes EN 60749-13:2002
English Version
Semiconductor devices - Mechanical and climatic test methods -
Part 13: Salt atmosphere
(IEC 60749-13:2018)
Dispositifs à semiconducteurs - Méthodes d'essais Halbleiterbauelemente - Mechanische und klimatische
mécaniques et climatiques - Partie 13: Atmosphère saline Prüfverfahren - Teil 13: Salzatmosphäre
(IEC 60749-13:2018) (IEC 60749-13:2018)
This European Standard was approved by CENELEC on 2018-03-22. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.



European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2018 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN IEC 60749-13:2018 E

---------------------- Page: 3 ----------------------

SIST EN IEC 60749-13:2018
EN IEC 60749-13:2018 (E)

European foreword
The text of document 47/2446/FDIS, future edition 2 of IEC 60749-13, prepared by IEC/TC 47
"Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN IEC 60749-13:2018.

The following dates are fixed:
(dop) 2018-12-22
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2021-03-22
standards conflicting with the
document have to be withdrawn

This document supersedes EN 60749-13:2002.

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 60749-13:2018 was approved by CENELEC as a European
Standard without any modification.
2

---------------------- Page: 4 ----------------------

SIST EN IEC 60749-13:2018
EN IEC 60749-13:2018 (E)

Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.

NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.

NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.

Publication Year Title EN/HD Year
IEC 60749-14 -  Semiconductor devices - Mechanical and EN 60749-14 -
climatic test methods -- Part 14:
Robustness of terminations (lead integrity)


3

---------------------- Page: 5 ----------------------

SIST EN IEC 60749-13:2018

---------------------- Page: 6 ----------------------

SIST EN IEC 60749-13:2018



IEC 60749-13

®


Edition 2.0 2018-02




INTERNATIONAL



STANDARD




NORME



INTERNATIONALE











Semiconductor devices – Mechanical and climatic test methods –

Part 13: Salt atmosphere



Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques –

Partie 13: Atmosphère saline















INTERNATIONAL

ELECTROTECHNICAL

COMMISSION


COMMISSION

ELECTROTECHNIQUE


INTERNATIONALE




ICS 31.080.01 ISBN 978-2-8322-5369-4



Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

---------------------- Page: 7 ----------------------

SIST EN IEC 60749-13:2018
– 2 – IEC 60749-13:2018 © IEC 2018
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Test apparatus . 5
5 Procedure . 6
5.1 Conditioning and maintenance of test chamber . 6
5.2 Initial preconditioning of leads . 6
5.3 Mounting of test specimens . 6
5.4 Chamber operation . 10
5.5 Length of test . 10
5.6 Examination . 11
5.7 Failure criteria . 11
5.7.1 Finished product . 11
5.7.2 Package elements . 12
6 Summary . 12
Bibliography . 14

Figure 1 – Dual-in-line packages with leads attached to, or exiting from package sides
(such as side-brazed packages and ceramic dual-in-line packages) . 7
Figure 2 – Packages with leads attached to, or exiting from the opposite side of the lid . 9
Figure 3 – Packages with leads attached to, or exiting from package sides, parallel to
lids (such as flatpacks) . 9
Figure 4 – Leadless and leaded chip carriers . 10
Figure 5 – Corrosion area charts . 13

Table 1 – Minimum duration of exposure . 11

---------------------- Page: 8 ----------------------

SIST EN IEC 60749-13:2018
IEC 60749-13:2018 © IEC 2018 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –

Part 13: Salt atmosphere

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and
non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates
closely with the International Organization for Standardization (ISO) in accordance with conditions determined
by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60749-13 has been prepared by IEC technical committee 47:
Semiconductor devices.
This second edition cancels and replaces the first edition published in 2002. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including
information on conditioning and maintenance of the test chamber and mounting of test
specimens (including explanatory figures).

---------------------- Page: 9 ----------------------

SIST EN IEC 60749-13:2018
– 4 – IEC 60749-13:2018 © IEC 2018
The text of this International Standard is based on the following documents:
FDIS Report on voting
47/2446/FDIS 47/2455/RVD

Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60749 series, published under the general title Semiconductor
devices – Mechanical and climatic test methods, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

---------------------- Page: 10 ----------------------

SIST EN IEC 60749-13:2018
IEC 60749-13:2018 © IEC 2018 – 5 –
SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –

Part 13: Salt atmosphere



1 Scope
This part of IEC 60749 describes a salt atmosphere test that determines the resis
...