EN 15063-1:2014

Copper and copper alloys - Determination of main constituents and impurities by wavelength dispersive X-ray fluorescence spectrometry (XRF) - Part 1: Guidelines to the routine method

This European Standard provides guidance on the concepts and procedures for the calibration and analysis of copper and copper alloys by wavelength dispersive X-ray fluorescence spectrometry.

Kupfer und Kupferlegierungen - Bestimmung von Hauptbestandteilen und Verunreinigungen durch wellenlängendispersive Röntgenfluoreszenzanalyse (RFA) - Teil 1: Leitfaden für das Routineverfahren

Dieser Teil dieser Europäischen Norm bietet eine Anleitung zu Konzepten und Arbeitsabläufen für die Kalibrierung und Analyse von Kupfer und Kupferlegierungen durch Röntgenfluoreszenzanalyse.

Cuivre et alliages de cuivre - Détermination des éléments principaux et des impuretés par spectrométrie de fluorescence X à dispersion de longueur d'onde (FRX) - Partie 1 : Lignes directrices pour la méthode de routine

Cette partie de la présente Norme européenne fournit des lignes directrices sur les concepts et les modes opératoires d’étalonnage et d’analyse du cuivre et des alliages de cuivre par spectrométrie de fluorescence X à dispersion en longueur d’onde.

Baker in bakrove zlitine - Določevanje glavnih sestavin in nečistoč z rentgensko fluorescenčno spektrometrijo (XRF) - 1. del: Smernice za rutinsko metodo

Ta del evropskega standarda vsebuje napotke glede konceptov in postopkov za umerjanje in analizo bakra in bakrovih zlitin z rentgensko fluorescenčno spektrometrijo.

General Information

• Status: Published
• Publication Date: 16-Dec-2014
• Withdrawal Date: 29-Jun-2015
• ICS: 77.040.20 - Non-destructive testing of metals
• ICS: 77.120.30 - Copper and copper alloys
• Technical Committee: CEN/TC 133 - Copper and copper alloys
• Drafting Committee: CEN/TC 133/WG 10 - Methods of analysis
• Current Stage: 9093 - Decision to confirm - Review Enquiry
• Completion Date: 24-Jun-2020
• Ref Project: SIST EN 15063-1:2015 - Copper and copper alloys - Determination of main constituents and impurities by wavelength dispersive X-ray fluorescence spectrometry (XRF) - Part 1: Guidelines to the routine method

Relations

• Replaces: EN 15063-1:2006 - Copper and copper alloys - Determination of main constituents and impurities by wavelength dispersive X-ray fluorescence spectrometry (XRF) - Part 1: Guidelines to the routine method
• Effective Date: 24-Dec-2014

Standards Content (Sample)

SLOVENSKI STANDARD
01-marec-2015
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SIST EN 15063-1:2007
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Copper and copper alloys - Determination of main constituents and impurities by
wavelength dispersive X-ray fluorescence spectrometry (XRF) - Part 1: Guidelines to the
routine method
Kupfer und Kupferlegierungen - Bestimmung von Hauptbestandteilen und
Verunreinigungen durch wellenlängendispersive Röntgenfluoreszenzanalyse (RFA) - Teil
1: Anleitungen für das Routineverfahren
Cuivre et alliages de cuivre - Détermination des éléments principaux et des impuretés
par analyse spectrométrique de fluorescence X à dispersion de longueur d'onde (FRX) -
Partie 1: Lignes directrices pour la méthode de routine
Ta slovenski standard je istoveten z: EN 15063-1:2014
ICS:
77.040.01 Preskušanje kovin na Testing of metals in general
splošno
77.120.30 Baker in bakrove zlitine Copper and copper alloys
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 15063-1
NORME EUROPÉENNE
EUROPÄISCHE NORM
December 2014
ICS 77.040.20; 77.120.30 Supersedes EN 15063-1:2006
English Version
Copper and copper alloys - Determination of main constituents
and impurities by wavelength dispersive X-ray fluorescence
spectrometry (XRF) - Part 1: Guidelines to the routine method
Cuivre et alliages de cuivre - Détermination des éléments Kupfer und Kupferlegierungen - Bestimmung von
principaux et des impuretés par spectrométrie de Hauptbestandteilen und Verunreinigungen durch
fluorescence X à dispersion de longueur d'onde (FRX) - wellenlängendispersive Röntgenfluoreszenzanalyse (RFA) -
Partie 1 : Lignes directrices pour la méthode de routine Teil 1: Leitfaden für das Routineverfahren
This European Standard was approved by CEN on 8 November 2014.

CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national
standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CEN member into its own language and notified to the CEN-CENELEC Management Centre has the same
status as the official versions.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania,
Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United
Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION

EUROPÄISCHES KOMITEE FÜR NORMUNG

CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2014 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN 15063-1:2014 E
worldwide for CEN national Members.

Contents Page
Foreword .3
Introduction .4
1 Scope .5
2 Principle .5
3 Terms and definitions .5
4 Instrumentation .7
4.1 Principles of X-ray fluorescence spectrometers .7
4.2 X-ray tubes .8
4.3 Vacuum system.9
4.4 Test sample spinner .9
4.5 Filters .9
4.6 Collimators of slits. 10
4.7 Analysing crystals . 10
4.8 Counters . 11
4.9 Simultaneous and sequential Instruments . 12
5 Sampling and test sample preparation . 12
6 Evaluation methods . 12
6.1 General . 12
6.2 Dead time correction . 12
6.3 Background correction . 13
6.4 Line interference correction models. 13
6.5 Inter-element effects correction models . 13
7 Calibration procedure . 14
7.1 General . 14
7.2 Optimizing of the diffraction angle (2θ) . 15
7.3 Selecting optimum conditions for detectors . 15
7.4 Selecting optimum tube voltage and current . 15
7.5 Selecting minimum measuring times . 15
7.6 Selecting calibration samples . 15
7.7 Selecting drift control and recalibration samples . 16
7.8 Measuring the calibration samples . 16
7.9 Regression calculations . 16
8 Method validation (accuracy and precision) . 16
9 Performance criteria . 17
9.1 General . 17
9.2 Precision test . 17
9.3 Performance monitoring . 17
9.4 Maintenance . 17
10 Radiation protection . 18
Annex A (informative) Example of calculating background equivalent concentration, limit of
detection, limit of quantification and lower limit of detection . 19
Annex B (informative) Example of calculating line interference of one element to another . 21
Annex C (informative) Example of performance criteria obtained under repeatability conditions . 22
Bibliography . 23

Foreword
This document (EN 15063-1:2014) has been prepared by Technical Committee CEN/TC 133 “Copper and
copper alloys”, the secretariat of which is held by DIN.
This European Standard shall be given the status of a national standard, either by publication of an identical
text or by endorsement, at the latest by June 2015 and conflicting national standards shall be withdrawn at the
latest by June 2015.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. CEN [and/or CENELEC] shall not be held responsible for identifying any or all such patent rights.
This document supersedes EN 15063-1:2006.
Within its programme of work, Technical Committee CEN/TC 133 requested CEN/TC 133/WG 10 “Methods of
analysis” to revise the following standard:
EN 15063-1:2006, Copper and copper alloys — Determination of main constituents and impurities by
wavelength dispersive X-ray fluorescence spectrometry (XRF) — Part 1: Guidelines to the routine method
This is one of two parts of the standard for the determination of main constituents and impurities in copper and
copper alloys. The other part is:
EN 15063-2, Copper and copper alloys — Determination of main constituents and impurities by wavelength
dispersive X-ray fluorescence spectrometry (XRF) — Part 2: Routine method
In comparison with EN 15063-1:2006, the following changes have been made:
a) Definition 3.1 and 3.2 modified;
b) Clause 5 modified;
c) Editorial modifications have been made.
According to the CEN-CENELEC Internal Regulations, the national standards organizations of the following
countries are bound to implement this European Standard: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech
Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece,
Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal,
Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
Introduction
Wavelength dispersive X-ray fluorescence spectrometry (XRF) has been used for several decades as an
important analytical tool for production analysis. XRF is characterised by its speed and high precision over a
wide concentration range and as the XRF-method in most cases is used as a relative method, the limitations
are often connected to the quality of the calibration samples. The technique is well established and most of
the physical fundamentals are well known.
This guideline is intended to be used for the analysis of copper and copper alloys but it may also be applied to
other materials.
1 Scope
This European Standard provides guidance on the concepts and procedures for the calibration and analysis of
copper and copper alloys by wavelength dispersive X-ray fluorescence spectrometry.
2 Principle
An appropriately prepared test sample is irradiated by an X-ray beam of high energy. The secondary X-rays
produced are dispersed by means of crystals and the intensities are measured by detectors at selected
characteristic wavelengths. Concentrations of elements are determined by relating the measured intensities of
test samples to calibration curves prepared from reference materials.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
reference material
RM
material, sufficiently homogeneous and stable with respect to one or more specified properties which has
been established to be fit for its intended use in a measurement process
[SOURCE: ISO GUIDE 30:1992/Amd.1:2008, definition 2.1]
3.2
certified reference material
CRM
reference material characterized by a metrologically valid procedure for one or more specified properties,
accompanied by a certificate, that provides the value of the specified property, its associated uncertainty, and
a statement of metrological traceability
[SOURCE: ISO GUIDE 30:1992/Amd.1:2008, definition 2.2]
3.3
test sample
representative quantity of material for testing purposes
3.4
calibration samples
series of certified reference materials or if not available, reference materials used for calibration
3.5
drift control samples
series of homogeneous materials that contain all the elements which have been calibrated and that cover the
low, mid and high points of the calibration range for each element, used to detect variations over time in these
points
Note 1 to entry: Drift control samples can also be used for sta
...