SIST EN 61124:2007
(Main)Reliability testing - Compliance tests for constant failure rate and constant failure intensity
Reliability testing - Compliance tests for constant failure rate and constant failure intensity
This International Standard gives a number of optimized test plans, the corresponding operating characteristic curves and expected test times. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to choose test plans. This standard specifies procedures to test whether an observed value of - failure rate, - failure intensity, - mean time to failure (MTTF), - mean operating time between failures (MTBF), conforms to a given requirement. It is assumed, except where otherwise stated, that during the accumulated test time, the times to failure or the operating times between failures are independent and identically exponentially distributed. This assumption implies that the failure rate or failure intensity is constant. Four types of test plans are described as follows: - truncated sequential tests; - time/failure terminated tests; - fixed calendar time terminated tests without replacement; - combined test plans.
Prüfungen der Funktionsfähigkeit - Prüfpläne für konstante Ausfallrate und konstante Ausfalldichte
Essais de fiabilité - Plans d'essais de conformité d'un taux de défaillance constant et d'une intensité de défaillance constante
La présente Norme internationale fournit un certain nombre de plans d'essais optimisés, les courbes d'efficacité associées et les valeurs moyennes des temps d'essais. De plus, les algorithmes pour la conception de plans d'essais à l'aide d'un tableur électronique sont également fournis avec des lignes directrices sur la manière de choisir les plans d'essais. La présente norme ne couvre pas les lignes directrices sur la manière de planifier, réaliser, analyser et faire un rapport sur un essai. Ces informations sont données dans la CEI 60300-3-5. La présente norme ne couvre pas les conditions d'essais. Ces informations sont données dans la CEI 60605-2 et la CEI 60605, Parties 3-1 à 3-6.
Preskušanje zanesljivosti – Ustreznostni preskusi za konstantno pogostost odpovedi in konstantno intenzivnost odpovedi (IEC 61124:2006)
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 61124:2007
01-januar-2007
Preskušanje zanesljivosti – Ustreznostni preskusi za konstantno pogostost
odpovedi in konstantno intenzivnost odpovedi (IEC 61124:2006)
Reliability testing - Compliance tests for constant failure rate and constant failure
intensity
Prüfungen der Funktionsfähigkeit - Prüfpläne für konstante Ausfallrate und konstante
Ausfalldichte
Essais de fiabilité - Plans d'essais de conformité d'un taux de défaillance constant et
d'une intensité de défaillance constante
Ta slovenski standard je istoveten z: EN 61124:2006
ICS:
19.020 Preskuševalni pogoji in Test conditions and
postopki na splošno procedures in general
21.020 =QDþLOQRVWLLQQDþUWRYDQMH Characteristics and design of
VWURMHYDSDUDWRYRSUHPH machines, apparatus,
equipment
SIST EN 61124:2007 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN 61124:2007
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SIST EN 61124:2007
EUROPEAN STANDARD
EN 61124
NORME EUROPÉENNE
June 2006
EUROPÄISCHE NORM
ICS 03.120.30; 19.020; 21.020
English version
Reliability testing -
Compliance tests for constant failure rate
and constant failure intensity
(IEC 61124:2006)
Essais de fiabilité - Prüfungen der Funktionsfähigkeit -
Plans d'essais de conformité d'un taux de Prüfpläne für konstante Ausfallrate
défaillance constant et d'une intensité de und konstante Ausfalldichte
défaillance constante (IEC 61124:2006)
(CEI 61124:2006)
This European Standard was approved by CENELEC on 2006-05-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61124:2006 E
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SIST EN 61124:2007
EN 61124:2006 - 2 -
Foreword
The text of document 56/1081/FDIS, future edition 2 of IEC 61124, prepared by IEC TC 56,
Dependability, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as
EN 61124 on 2006-05-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2007-02-01
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2009-05-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61124:2006 was approved by CENELEC as a European
Standard without any modification.
__________
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SIST EN 61124:2007
- 3 - EN 61124:2006
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
1)
IEC 60050-191 - International Electrotechnical Vocabulary - -
(IEV)
Chapter 191: Dependability and quality of
service
IEC 60300-3-5 2001 Dependability management - -
Part 3-5: Application guide - Reliability test
conditions and statistical test principles
1)
IEC 60605-2 - Equipment reliability testing - -
Part 2: Design of test cycles
IEC 60605-3 Series Equipment reliability testing - -
Part 3: Preferred test conditions
IEC 60605-4 2001 Equipment reliability testing - -
Part 4: Statistical procedures for exponential
distribution - Point estimates, confidence
intervals, prediction intervals and tolerance
intervals
1)
IEC 60605-6 - Equipment reliability testing - -
Part 6: Tests for the validity of the constant
failure rate or constant failure intensity
assumptions
IEC 61123 1991 Reliability testing - Compliance test plans for - -
success ration
1)
Undated reference.
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SIST EN 61124:2007
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SIST EN 61124:2007
NORME CEI
INTERNATIONALE
IEC
61124
INTERNATIONAL
Deuxième édition
STANDARD
Second edition
2006-03
Essais de fiabilité –
Plan d'essais de conformité d'un taux de
défaillance constant et d'une intensité
de défaillance constante
Reliability testing –
Compliance tests for constant failure rate
and constant failure intensity
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Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
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Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
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МеждународнаяЭлектротехническаяКомиссия
Pour prix, voir catalogue en vigueur
For price, see current catalogue
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SIST EN 61124:2007
61124 © IEC:2006 – 3 –
CONTENTS
FOREWORD. 15
1 Scope. 19
2 Normative references. 19
3 Terms, definitions, symbols and acronyms . 21
3.1 Terms and definitions . 21
3.2 Acronyms and symbols . 21
4 General requirements and area of application. 25
4.1 Requirements . 25
4.2 Applicability to replaced and repaired items . 25
4.3 Types of test plans. 27
5 General test procedure. 29
5.1 Test conditions . 29
5.2 General characteristics of the test plans. 29
5.3 Data to be recorded. 31
*
5.4 Calculation of accumulated test time, T . 31
5.5 Number of failures. 33
6 Sequential test plans . 33
6.1 General. 33
6.2 Common test procedure. 33
6.3 Decision criteria. 35
6.4 Overview of test plans . 35
7 Fixed time/failure terminated test plans – Fixed duration test plans. 37
7.1 General. 37
7.2 Common test procedure. 37
7.3 Decision criteria. 37
7.4 Test plans . 39
8 Design of alternative time/failure terminated test plans . 39
8.1 General. 39
8.2 Design procedures . 41
8.3 Common test procedure. 41
8.4 Decision criteria. 41
9 Calendar time/failure terminated test plans for non-replaced items . 43
9.1 General. 43
9.2 Common test procedure. 43
9.3 Decision criteria. 43
9.4 Use of Table 2 of IEC 61123:1991 for fixed calendar time tests . 45
10 Combined test plans . 47
10.1 General. 47
10.2 Common test procedure. 47
10.3 Decision criteria. 47
10.4 Test plans . 49
11 Performing the test . 49
12 Presentation of results . 49
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SIST EN 61124:2007
61124 © IEC:2006 – 5 –
Annex A (normative) Tables and graphs for sequential test plans . 51
Annex B (normative) Graphs for fixed time/failure terminated test plans . 89
Annex C (normative) Graphs for alternative time/failure terminated test plans. 107
Annex D (normative) Tables and graphs for combined test plans and additional
sequential test plans. 121
Annex E (informative) Examples and mathematical references for sequential test
plans. 159
Annex F (informative) Design of sequential test plans using a spreadsheet program. 175
Annex G (informative) Examples and mathematical references for fixed duration
time/failure terminated test plans . 197
Annex H (informative) Design of fixed duration time/failure terminated test plans
using a spreadsheet program. 201
Annex I (informative) Examples and mathematical references for the design of
alternative time/failure terminated test plans . 213
Annex J (informative) Examples and mathematical references for the calendar time
terminated test plans . 229
Annex K (informative) Derivation and mathematical reference for the optimized test
plans of GOST 27.402 . 233
Bibliography. 249
Figure A.1 – Accept and reject lines for test plan A.1 . 51
Figure A.2 – Test plan A.1 – Operating characteristic curve . 55
Figure A.3 – Test plan A.1 – Expected accumulated test time to decision. 55
Figure A.4 – Accept and reject lines for test plan A.2 . 57
Figure A.5 – Test plan A.2 – Operating characteristic curve . 59
Figure A.6 – Test plan A.2 – Expected accumulated test time to decision. 59
Figure A.7 – Accept and reject lines for test plan A.3 . 61
Figure A.8 – Test plan A.3 – Operating characteristic curve . 63
Figure A.9 – Test plan A.3 – Expected accumulated test time to decision. 63
Figure A.10 – Accept and reject lines for test plan A.4. 65
Figure A.11 – Test plan A.4 – Operating characteristic curve . 67
Figure A.12 – Test plan A.4 – Expected accumulated test time to decision . 67
Figure A.13 – Accept and reject lines for test plan A.5. 69
Figure A.14 – Test plan A.5 – Operating characteristic curve . 71
Figure A.15 – Test plan A.5 – Expected accumulated test time to decision . 71
Figure A.16 – Accept and reject lines for test plan A.6. 73
Figure A.17 – Test plan A.6 - Operating characteristic curve. 75
Figure A.18 – Test plan A.6 – Expected accumulated test time to decision . 75
Figure A.19 – Accept and reject lines for test plan A.7. 77
Figure A.20 – Test plan A.7 – Operating characteristic curve . 79
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SIST EN 61124:2007
61124 © IEC:2006 – 7 –
Figure A.21 – Test plan A.7 – Expected accumulated test time to decision . 79
Figure A.22 – Accept and reject lines for test plan A.8. 81
Figure A.23 – Test plan A.8 – Operating characteristic curve . 83
Figure A.24 – Test plan A.8 – Expected accumulated test time to decision . 83
Figure A.25 – Accept and reject lines for test plan A.9. 85
Figure A.26 – Test plan A.9 – Operating characteristic curve . 87
Figure A.27 – Test plan A.9 – Expected accumulated test time to decision . 87
Figure B.1 – Operating characteristic curves for test plans B.1, B.2, B.3 and B.4 . 89
Figure B.2 – Test plan B.1 – Expected test time to decision . 91
Figure B.3 – Test plan B.2 – Expected test time to decision . 91
Figure B.4 – Test plan B.3 – Expected test time to decision . 93
Figure B.5 – Test plan B.4 – Expected test time to decision . 93
Figure B.6 – Operating characteristic curves for test plans B.5, B.6, B.7 and B.8 . 95
Figure B.7 – Test plan B.5 – Expected test time to decision . 95
Figure B.8 – Test plan B.6 – Expected test time to decision . 97
Figure B.9 – Test plan B.7 – Expected test time to decision . 97
Figure B.10 – Test plan B.8 – Expected test time to decision . 99
Figure B.11 – Operating characteristic curves for test plans B.9, B.10 and B.11. 99
Figure B.12 – Test plan B.9 – Expected test time to decision . 101
Figure B.13 – Test plan B.10 – Expected test time to decision. 101
Figure B.14 – Test plan B.11– Expected test time to decision . 103
Figure B.15 – Operating characteristic curves for test plans B.12 and B.13 . 103
Figure B.16 – Test plan B.12 – Expected test time to decision. 105
Figure B.17 – Test plan B.13 – Expected test time to decision. 105
Figure C.1 – Discrimination ratio, D, and the acceptable number of failures, c = 0 to 8,
as a function of the expected number of failures, μ , for recommended values, 2,5%,
0
5%, 10%, 20%, and 30% of α = β. 113
Figure C.2 – Operation characteristic curves for c = 0 to 8; probability of acceptance
P as a function of the (unknown) true expected number of failures, μ. 115
a
Figure C.3 – Discrimination ratio, D, as a function of the expected number of failures,
μ , for recommended values, 2,5%, 5%, 10%, 15%, 20% and 30% of α = β . 117
0
Figure C.4 – Acceptable number of failures c minus expected number of failures, μ
0
Δμ = c − μ as a function of the expected number of failures μ for recommended
0 0 0
values 2,5%, 5%, 10%, 20%, and 30% of α = β. 119
Figure D.1 – Accept and reject lines . 123
∗
Figure D.2 – Expected test time to decision T . 125
e
∗
Figure D.3 – Expected test time to decision of acceptance T (+) . 125
e
Figure D.4 – Operating characteristic P . 125
a
Figure D.5 – Accept and reject lines . 127
∗
T
Figure D.6 – Expected test time to decision . 131
e
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SIST EN 61124:2007
61124 © IEC:2006 – 9 –
∗
Figure D.7 – Expected test time to decision of acceptance T (+) . 131
e
Figure D.8 – Operating characteristic P . 131
a
Figure D.9 – Accept and reject lines . 135
∗
Figure D.10 – Expected test time to decision T . 137
e
∗
Figure D.11 – Expected test time to decision of acceptance T (+) . 137
e
Figure D.12 – Operating characteristic P . 137
a
Figure D.13 – Accept and reject lines . 139
∗
Figure D.14 – Expected test time to decision T . 141
e
∗
Figure D.15 – Expected test time to decision of acceptance T (+) . 141
e
Figure D.16 – Operating characteristic P . 141
a
Figure D.17 – Accept and reject lines . 143
∗
Figure D.18 – Expected test time to decision . 145
T
e
∗
Figure D.19 – Expected test time to decision of acceptance T (+) . 145
e
Figure D.20 – Operating characteristic P . 145
a
Figure D.21 – Accept and reject lines . 147
∗
Figure D.22 – Expected test time to decision T . 149
e
∗
Figure D.23 – Expected test time to decision of acceptance T (+) . 149
e
Figure D.24 – Operating characteristic P . 149
a
Figure D.25 – Accept and reject lines . 151
∗
Figure D.26 – Expected test time to decision T . 153
e
∗
Figure D.27 – Expected test time to decision of acceptance T (+) . 153
e
Figure D.28 – Operating characteristic P . 153
a
Figure D.29 – Accept and reject lines . 155
*
Figure D.30 – Expected test time to decision T . 157
e
∗
Figure D.31 – Expected test time to decision of acceptance T (+) . 157
e
Figure D.32 – Operating characteristic P . 157
a
Figure E.1 – Example of a sequential test using test plan A.3 – α = β = 10 %, D = 3,
*
6
m = 1,11×10 h; r versus t . 165
0
Figure F.1 – Beginning of the spreadsheet prepared to obtain a sequential test and
graph . 177
Figure F.2 – Continuation of parameters calculation for the lines necessary for the
SPRT graph. 179
Figure F.3 – Calculations of accept and reject line for the SPRT graph . 179
Figure F.4 – Determination of the test termination time. 181
Figure F.5 – Equations for accept and reject line along with the test termination . 185
Figure F.6 – SPRT spreadsheet graphing example . 187
Figure F.7 – Spreadsheet set-up for construction of the OC curves for the SPRT . 191
Figure F.8 – OC curve for probability of acceptance, P . 193
a
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SIST EN 61124:2007
61124 © IEC:2006 – 11 –
Figure H.1 – Set-up of the spreadsheet with embedded equations – Example. 203
Figure H.2 – Equations embedded into the spreadsheet shown in Figure F.1. 205
Figure H.3 – OC curve for the time/failure terminated fixed duration test . 209
Figure H.4 – OC curve plotted from the spreadsheet calculations . 211
Figure K.1 – Test plan types and terminology . 235
Figure K.2 – Principle of test plans. 239
Figure K.3 – Partitioning of the test plan graph . 239
Figure K.4 – Interior nodes and border nodes. 239
Figure K.5 – Paths to the accept line . 241
Figure K.6 – Paths to the reject line. 241
Figure K.7 – Probabilities of paths transfer between nodes. 243
Figure K.8 – The recurrent element – Two cases . 247
Table 1 – Advantages and disadvantages for the different test plan types . 27
Table 2 – Overview of the sequential test plans given in Annex A and D . 35
Table 3 – Fixed time/failure terminated test plans . 39
Table 4 – Combined test plans in Annex D . 49
Table A.1 – Accept and reject lines for test plan A.1 . 53
Table A.2 – Accept and reject lines for test plan A.2 . 57
Table A.3 – Accept and reject lines for test plan A.3 . 61
Table A.4 – Accept and reject lines for test plan A.4 . 65
Table A.5 – Accept and reject lines for test plan A.5 . 69
Table A.6 – Accept and reject lines for test plan A.6 . 73
Table A.7 – Accept and reject lines for test plan A.7 . 77
Table A.8 – Accept and reject lines for test plan A.8 . 81
Table A.9 – Accept and reject lines for test plan A.9 . 85
Table D.1 – Sequential test plans in Annex D . 121
Table D.2 – Combined test plans in Annex D. 121
Table D.3 – Accept and reject lines . 123
Table D.4 – Expected test time to decision and operating characteristic P . 127
a
Table D.5 – Accept and reject lines . 129
Table D.6 – Expected test time to decision and operating characteristic P . 133
a
Table D.7 – Accept and reject lines . 135
Table D.8 – Expected test time to decision and operating characteristic P . 137
a
Table D.9 – Accept and reject lines . 139
Table D.10 – Expected test time to decision and operating characteristic P . 141
a
Table D.11 – Accept and reject lines . 143
Table D.12 – Expected test time to decision and operating characteristic P . 145
a
Table D.13 – Accept and reject lines . 147
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Table D.14 – Expected test time to decision and operating characteristic P . 149
a
Table D.16 – Expected test time to decision and operating characteristic P . 153
a
Table D.17 – Accept and reject lines . 155
Table D.18 – Expected test time to decision and operating characteristic P . 157
a
Table E.1 – Example for a sequential test using test plan A.3 (with exampl
...
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