Reliability testing - Compliance tests for constant failure rate and constant failure intensity

IEC 61124:2012 gives a number of optimized test plans, the corresponding operating characteristic curves and expected test times. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to choose test plans. This standard specifies procedures to test whether an observed value of: failure rate, failure intensity, meantime to failure (MTTF), and mean operating time between failures (MTBF). The main changes with respect to the previous edition are as follows: - A number of new test plans have been added based on the Russian standard GOST R 27.402 [1], and it is intended to align the new edition of MIL-HDBK-781 [2] with this edition. Algorithms for optimizing test plans using a spreadsheet program are given and a number of optimized test plans are listed. Furthermore, emphasis is laid on the fact that the test should be repeated following design changes; - Discrepancies in test plans A, B as well as Annexes A and B that originated in IEC 60605-7 [3], now withdrawn, have been corrected so these test plans differ from those given in previous editions of IEC 61124. As requested by the National Committees, mathematical background material and spreadsheet program information has been moved to informative annexes. In addition, the symbol lists have been divided, so that some annexes have separate lists of symbols; - Guidance on how to choose test plans has been added as well as guidance on how to use spreadsheet programs to create them. Test plans A.1 to A.9 and B.1 to B.13 have been corrected; - Subcluses 8.1, 8.2, 8.3, Clause 9, Annex C, Clauses G.2, I.2, I.3 and Annex J are unchanged, except for updated terminology and references.

Prüfungen der Funktionsfähigkeit - Prüfpläne für konstante Ausfallrate und konstante Ausfalldichte

Essais de fiabilité - Plan d'essais de conformité d'un taux de défaillance constant et d'une intensité de défaillance constante

La CEI 61124:2012 fournit un certain nombre de plans d'essais optimisés, les courbes OC associées et les valeurs moyennes des temps d'essais. De plus, les algorithmes pour la conception de plans d'essais à l'aide d'un tableur électronique sont également fournis avec des lignes directrices sur la manière de choisir les plans d'essais. La présente norme spécifie les méthodes utilisées pour vérifier qu'une valeur observée: d'un taux de défaillance, d'une intensité de défaillance, d'une durée moyenne de fonctionnement avant défaillance (MTTF), moyenne des temps de bon fonctionnement (MTBF). Les modifications techniques majeures par rapport à l'édition précédente sont les suivantes: - de nouveaux plans d'essais sont ajoutés, basés sur la Norme russe GOST R 27.402 [1], et son objectif est d'être cohérent avec la nouvelle édition de MIL-HDBK-781 [2]. Elle comprend les algorithmes pour l'optimisation des plans d'essais en utilisant un tableur électronique, ainsi qu'une liste de plan d'essais. En outre l'accent est mis sur le fait qu'il convient de réitérer l'essai à la suite des modifications de conception; - Les écarts dans les plans d'essais A, B et les Annexes A et B qui provenaient de la CEI 60605-7 [3], (retirée) ont été corrigés et ces plans sont donc différents de ceux donnés dans les précedentes éditions de la CEI 61124. Comme demandé par les Comités nationaux, les informations concernant la base mathématique et le tableur électronique ont été déplacées aux annexes informatives. De plus, les listes de symboles ont été divisées, pour obtenir des listes de symboles séparées dans certaines annexes. - Des lignes directrices sur la manière de choisir les plans d'essais ont été ajoutées de même que sur la manière d'utiliser les tableurs électroniques pour les créer. Les plans d'essais A.1 à A.9 et B.1 à B.13 ont été corrigés; - Les paragraphes 8.1, 8.2, 8.3, l'Article 9 et l'Annexe C, les Articles G.2, I.2, I.3 et l'Annexe J ne changent pas, sauf pour la terminologie et les références mises à jour.

Preskušanje zanesljivosti - Ustreznostni preskusi za konstantno pogostost odpovedi in konstantno intenzivnost odpovedi

Ta mednarodni standard navaja optimizirane preskusne načrte, ustrezne značilne krivulje delovanja in pričakovana trajanja preskusov. Poleg tega navaja algoritme za projektiranje preskusnih načrtov s programom s preglednicami in smernice za izbiro preskusnih načrtov. Ta standard določa postopke za preskušanje, ali je meritev – pogostosti odpovedi, – intenzivnosti odpovedi, – povprečnega trajanja odpovedi (MTTF), – povprečnega trajanja delovanja med odpovedmi (MTBF) v skladu z danimi zahtevami. Če ni navedeno drugače, se predpostavlja, da so trajanja odpovedi ali povprečna trajanja delovanja med odpovedmi med skupnim trajanjem preskusov ločena in enakomerno eksponentno razporejena. Ta predpostavka pomeni, da je pogostost odpovedi ali intenzivnost odpovedi konstantna. Opisane so štiri vrste preskusnih načrtov: – prekinjeni(okrnjeni?) sekvenčni preskusi; – časovno/z odpovedjo zaključeni preskusi; – preskusi, zaključeni brez nadomestil z določenim koledarskim časom; – kombinirani preskusni načrti. Ta standard ne zajema smernic za načrtovanje, izvajanje in analizo preskusa ter poročanje o njem. Te informacije so navedene v standardu IEC 60300-3-5.

General Information

Status
Published
Publication Date
09-Aug-2012
Withdrawal Date
26-Jun-2015
Technical Committee
Drafting Committee
Parallel Committee
Current Stage
6060 - Document made available - Publishing
Start Date
10-Aug-2012
Completion Date
10-Aug-2012

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SLOVENSKI STANDARD
01-oktober-2012
Preskušanje zanesljivosti - Ustreznostni preskusi za konstantno pogostost
odpovedi in konstantno intenzivnost odpovedi
Reliability testing - Compliance tests for constant failure rate and constant failure
intensity
Prüfungen der Funktionsfähigkeit - Prüfpläne für konstante Ausfallrate und konstante
Ausfalldichte
Essais de fiabilité - Plans d'essais de conformité d'un taux de défaillance constant et
d'une intensité de défaillance constante
Ta slovenski standard je istoveten z: EN 61124:2012
ICS:
19.020 Preskuševalni pogoji in Test conditions and
postopki na splošno procedures in general
21.020 =QDþLOQRVWLLQQDþUWRYDQMH Characteristics and design of
VWURMHYDSDUDWRYRSUHPH machines, apparatus,
equipment
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 61124
NORME EUROPÉENNE
August 2012
EUROPÄISCHE NORM
ICS 03.120.30; 19.020; 21.020 Supersedes EN 61124:2006

English version
Reliability testing -
Compliance tests for constant failure rate
and constant failure intensity
(IEC 61124:2012)
Essais de fiabilité -  Prüfungen der Funktionsfähigkeit -
Plan d'essais de conformité d'un taux Prüfpläne für konstante Ausfallrate
de défaillance constant et d'une intensité und konstante Ausfalldichte
de défaillance constante (IEC 61124:2012)
(CEI 61124:2012)
This European Standard was approved by CENELEC on 2012-06-27. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the CEN-CENELEC Management Centre has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,
Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland,
Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels

© 2012 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61124:2012 E
Foreword
The text of document 56/1461/FDIS, future edition 3 of IEC 61124, prepared by IEC/TC 56
"Dependablility" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
The following dates are fixed:
(dop) 2013-03-27
• latest date by which the document has
to be implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2015-06-27
• latest date by which the national
standards conflicting with the
document have to be withdrawn
This document supersedes EN 61124:2006.

- a number of new test plans have been added based on the Russian standard GOST R 27.402, and
it is intended to align the new edition of MIL-HDBK-781 with this edition. Algorithms for optimizing
test plans using a spreadsheet program are given and a number of optimized test plans are listed.
Furthermore, emphasis is laid on the fact that the test should be repeated following design
changes;
- discrepancies in test plans A, B as well as Annexes A and B that originated in IEC 60605-7, now
withdrawn, have been corrected so these test plans differ from those given in previous edition of
EN 61124. As requested by the National committees, mathematical background material and
spreadsheet program information has been moved to informative annexes. In addition, the symbol
lists have been divided, so that some annexes have separate lists of symbols;
- guidance on how to choose test plans has been added as well as guidance on how to use
spreadsheet programs to create them. Test plans A.1 to A.9 and B.1 to B.13 have been corrected;
- Subclauses 8.1, 8.2, 8.3, Clause 9, Annex C, Clauses G.2, I.2, I.3 and Annex J are unchanged,
except for updated terminology and references;
- corrections to the second edition proposed by National Committees have been implemented.

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 61124:2012 was approved by CENELEC as a European
Standard without any modification.

- 3 - EN 61124:2012
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

IEC 60050-191 - International Electrotechnical Vocabulary - -
(IEV) -
Chapter 191: Dependability and quality
of service
IEC 60300-3-5 2001 Dependability management - - -
Part 3-5: Application guide - Reliability test
conditions and statistical test principles

IEC 60605-2 - Equipment reliability testing - - -
Part 2: Design of test cycles
IEC 60605-4 2001 Equipment reliability testing - - -
Part 4: Statistical procedures for exponential
distribution - Point estimates, confidence
intervals, prediction intervals and tolerance
intervals
IEC 60605-6 - Equipment reliability testing - - -
Part 6: Tests for the validity and estimation
of the constant failure rate and constant
failure intensity
IEC 61123 1991 Reliability testing - Compliance test plans for - -
success ratio
IEC 61124 ®
Edition 3.0 2012-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Reliability testing – Compliance tests for constant failure rate and constant

failure intensity
Essais de fiabilité – Plan d’essais de conformité d’un taux de défaillance

constant et d’une intensité de défaillance constante

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XF
ICS 03.120.30; 19.020; 21.020 ISBN 978-2-88912-061-1

– 2 – 61124 © IEC:2012
CONTENTS
FOREWORD . 8
1 Scope . 10
2 Normative references . 10
3 Terms, definitions, abbreviations and symbols . 11
3.1 Terms and definitions . 11
3.2 Abbreviations and symbols . 11
3.2.1 Abbreviations . 11
3.2.2 Symbols . 11
4 General requirements and area of application . 13
4.1 Requirements . 13
4.2 Applicability to replaced and repaired items . 13
4.3 Types of test plans . 13
4.3.1 General . 13
4.3.2 Advantages and disadvantages of the different test plan types . 14
5 General test procedure . 14
5.1 Test conditions . 14
5.2 General characteristics of the test plans . 15
5.3 Data to be recorded . 15
*
5.4 Calculation of accumulated test time, T . 15
5.5 Number of failures . 16
6 Sequential test plans . 17
6.1 General . 17
6.2 Common test procedure . 17
6.3 Decision criteria . 17
6.4 Overview of test plans . 17
7 Fixed time/failure terminated test plans – Fixed duration test plans . 18
7.1 General . 18
7.2 Common test procedure . 18
7.3 Decision criteria . 19
7.4 Test plans . 19
8 Design of alternative time/failure terminated test plans . 20
8.1 General . 20
8.2 Design procedures . 20
8.3 Common test procedure . 20
8.4 Decision criteria . 21
9 Calendar time/failure terminated test plans for non-replaced items . 21
9.1 General . 21
9.2 Common test procedure . 21
9.3 Decision criteria . 21
9.4 Use of Table 2 of IEC 61123:1991 for fixed calendar time tests . 22
9.4.1 General . 22
9.4.2 Procedure when the test time is given . 22
9.4.3 Procedure when the number of items is given . 22
10 Combined test plans . 23

61124 © IEC:2012 – 3 –
10.1 General . 23
10.2 Common test procedure . 23
10.3 Decision criteria . 23
10.4 Test plans . 24
11 Performing the test . 24
12 Presentation of results . 24
Annex A (normative) Tables and graphs for sequential test plans . 25
Annex B (normative) Graphs for fixed time/failure terminated test plans . 44
Annex C (normative) Graphs for alternative time/failure terminated test plans . 53
Annex D (normative) Tables and graphs for combined test plans and additional
sequential test plan
...

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