Advanced technical ceramics - Methods of test for ceramic coatings - Part 10: Determination of coating thickness by cross sectioning

This document specifies a method of measuring the thickness of ceramic coatings by means of examination of a metallographically prepared cross-section of the coating in a calibrated optical or scanning electron microscope. It draws strongly on EN ISO 9220 [8], modifying and updating as required to be relevant to ceramic coatings and current best practice.

Hochleistungskeramik - Verfahren zur Prüfung keramischer Schichten - Teil 10: Bestimmung der Schichtdicke mittels Querschliff

Céramiques techniques avancées - Méthodes d'essai pour les revêtements céramiques - Partie 10: Détermination de l'épaisseur du revêtement par découpage transverse

Sodobna tehnična keramika – Metode za preskušanje keramičnih prevlek – 10. del: Ugotavljanje debeline prevleke s prečnim prerezom

General Information

Status
Withdrawn
Publication Date
20-Jul-2004
Current Stage
9960 - Withdrawal effective - Withdrawal
Start Date
15-Jul-2009
Completion Date
15-Jul-2009

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TS CEN/TS 1071-10:2005
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SLOVENSKI STANDARD
SIST-TS CEN/TS 1071-10:2005
01-januar-2005
6RGREQDWHKQLþQDNHUDPLND±0HWRGH]DSUHVNXãDQMHNHUDPLþQLKSUHYOHN±GHO
8JRWDYOMDQMHGHEHOLQHSUHYOHNHVSUHþQLPSUHUH]RP
Advanced technical ceramics - Methods of test for ceramic coatings - Part 10:
Determination of coating thickness by cross sectioning
Hochleistungskeramik - Verfahren zur Prüfung keramischer Schichten - Teil 10:
Bestimmung der Schichtdicke mittels Querschliff
Céramiques techniques avancées - Méthodes d'essai pour les revetements céramiques -
Partie 10: Détermination de l'épaisseur du revetement par découpage transverse
Ta slovenski standard je istoveten z: CEN/TS 1071-10:2004
ICS:
25.220.99 Druge obdelave in prevleke Other treatments and
coatings
81.060.30 Sodobna keramika Advanced ceramics
SIST-TS CEN/TS 1071-10:2005 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST-TS CEN/TS 1071-10:2005

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SIST-TS CEN/TS 1071-10:2005
TECHNICAL SPECIFICATION
CEN/TS 1071-10
SPÉCIFICATION TECHNIQUE
TECHNISCHE SPEZIFIKATION
July 2004
ICS 17.040.20; 25.220.99; 81.060.30
English version
Advanced technical ceramics - Methods of test for ceramic
coatings - Part 10: Determination of coating thickness by cross
sectioning
Céramiques techniques avancées - Méthodes d'essai pour Hochleistungskeramik - Verfahren zur Prüfung keramischer
les revêtements céramiques - Partie 10: Détermination de Schichten - Teil 10: Bestimmung der Schichtdicke mittels
l'épaisseur du revêtement par découpage transverse Querschliff
This Technical Specification (CEN/TS) was approved by CEN on 2 March 2004 for provisional application.
The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to submit their
comments, particularly on the question whether the CEN/TS can be converted into a European Standard.
CEN members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS available
promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in parallel to the CEN/TS)
until the final decision about the possible conversion of the CEN/TS into an EN is reached.
CEN members are the national standards bodies of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France,
Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia,
Slovenia, Spain, Sweden, Switzerland and United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION
EUROPÄISCHES KOMITEE FÜR NORMUNG
Management Centre: rue de Stassart, 36  B-1050 Brussels
© 2004 CEN All rights of exploitation in any form and by any means reserved Ref. No. CEN/TS 1071-10:2004: E
worldwide for CEN national Members.

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SIST-TS CEN/TS 1071-10:2005
CEN/TS 1071-10:2004 (E)
Contents Page
Foreword. 4
Introduction . 5
1 Scope. 6
2 Normative references . 6
3 Terms and definitions. 6
4 Principle . 6
5 Apparatus . 6
5.1 Scanning electron microscope (SEM) . 6
5.2 Optical microscope. 6
6 Sample preparation. 7
6.1 Cross-section preparation . 7
6.2 Surface roughness.
...

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