EN 60758:2005
(Main)Synthetic quartz crystal - Specifications and guide to the use
Synthetic quartz crystal - Specifications and guide to the use
Applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control and selection.
Synthetischer Quarzkristall - Festlegungen und Leitfaden für die Anwendung
Quartz synthétique - Spécifications et guide d'utilisation
Applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control and selection.
Sintetični kremenčev kristal – Specifikacije in vodilo za uporabo (IEC 60758:2004)
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Standards Content (Sample)
SLOVENSKI SIST EN 60758:2005
STANDARD
december 2005
Sintetični kremenčev kristal – Specifikacije in vodilo za uporabo (IEC
60758:2004)
Synthetic quartz crystal – Specifications and guide to the use (IEC 60758:2004)
ICS 31.140 Referenčna številka
© Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno
EUROPEAN STANDARD EN 60758
NORME EUROPÉENNE
EUROPÄISCHE NORM February 2005
ICS 31.140
English version
Synthetic quartz crystal –
Specifications and guide to the use
(IEC 60758:2004)
Quartz synthétique – Synthetischer Quarzkristall -
Spécifications et guide d'utilisation Festlegungen und Leitfaden
(CEI 60758:2004) für die Anwendung
(IEC 60758:2004)
This European Standard was approved by CENELEC on 2005-02-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden,
Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2005 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60758:2005 E
Foreword
The text of document 49/696/FDIS, future edition 3 of IEC 60758, prepared by IEC TC 49,
Piezoelectric and dielectric devices for frequency control and selection, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as EN 60758 on 2005-02-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2005-11-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2008-02-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60758:2004 was approved by CENELEC as a European
Standard without any modification.
__________
- 3 - EN 60758:2005
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE Where an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
1)
IEC 60068-1 1988 Environmental testing EN 60068-1 1994
Part 1: General and guidance
IEC 60122-1 2002 Quartz crystal units of assessed quality EN 60122-1 2002
Part 1: Generic specification
IEC 60410 1973 Sampling plans and procedures for - -
inspection by attributes
IEC 61994 Series Piezoelectric and dielectric devices for - -
frequency control and selection -
Glossary
1)
EN 60068-1 includes corrigendum October 1988 + A1:1992 to IEC 60068-1.
INTERNATIONAL IEC
STANDARD
Third edition
2004-12
Synthetic quartz crystal –
Specifications and guide to the use
� IEC 2004 � Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
PRICE CODE
Commission Electrotechnique Internationale X
International Electrotechnical Commission
For price, see current catalogue
– 2 – 60758 � IEC:2004(E)
CONTENTS
FOREWORD.4
1 Scope.6
2 Normative references .6
3 Terms and definitions .6
4 Specification for as-grown synthetic quartz crystal.10
4.1 Standard values .10
4.2 Requirements and measuring methods .11
4.3 Marking .17
5 Specification for lumbered synthetic quartz crystal .18
5.1 Standard values .18
5.2 Requirements and measuring methods .18
5.3 Delivery conditions .19
6 Inspection rule for synthetic quartz crystal and lumbered synthetic quartz crystal .19
6.1 Inspection rule for as-grown synthetic quartz crystal.19
6.2 Inspection rule for lumbered synthetic quartz crystal .20
7 Guide to the use of synthetic quartz crystal .21
7.1 General .21
7.2 Shape and size of synthetic quartz crystal .22
7.3 Standard method for evaluating the quality of synthetic quartz crystal .23
7.4 Other methods for checking the quality of synthetic quartz crystal .23
7.5 Alpha-grade.24
7.6 Optional grading (only as ordered), in inclusions, etch channels, Al content .24
7.7 Ordering .26
Annex A (informative) Frequently used sampling procedures .36
Annex B (informative) Numerical example.38
Annex C (informative) Example of reference sample selection .39
Annex D (informative) Explanations of point callipers.40
Annex E (informative) Infrared absorbance alpha value compensation .41
Bibliography.45
Figure 1 – Idealized sections of a synthetic quartz crystal grown on a Z-cut seed .27
Figure 2 – Quartz crystal axis and face designation .28
Figure 3 – Typical example of cutting wafers of AT-cut plate, minor rhombohedral-cut
plate, X-cut plate, Y-cut plate and Z-cut plate .29
Figure 4 – Frequency-temperature characteristics of the test specimen for slope.30
Figure 5 – Quartz crystal axis and face designation .31
Figure 6 – A synthetic quartz crystal grown on a Z-cut seed of small X-dimensions
(Crystals of other shapes are produced when Z-cut seeds of other proportions, or seeds
of other cuts, are used.) .32
Figure 7 – An example of an early 1970s relation between the extinction coefficient of
infra-red radiation and the Q-value of synthetic quartz .32
60758 � IEC:2004(E) – 3 –
Figure 8 – Lumbered synthetic quartz crystal outline and dimensions along X-, Y- and
Z-axes .33
Figure 9 – Angular deviation for reference surface.34
Figure 10 – Centrality of the seed with respect to the dimension along the Z- or Z�-axis.35
Figure D.1a � Point callipers .40
Figure D.1b � Digital point callipers.40
Figure E.1 – Schematic of measurement set-up .42
Figure E.2 � Graph relationship between averaged alpha and measured alpha at three
wave numbers of � , � and � .44
3500 3585 3410
Table 1 – Inclusion densities for the grades .10
Table 2 – Infra-red quality indications for the grades.10
Table 3 – Etch channel densities for the grades .11
Table 4 � Test conditions and requirements for the lot-by-lot test for group A .20
Table 5 � Test conditions and requirements for the lot-by-lot test for group B .20
Table 6 � Test conditions and requirements for the lot-by-lot test.21
Table B.1 � Commodity bar sampling method 1 .38
Table B.2 � Commodity bar sampling .38
Table E.1 � Example of calibration data at � .43
Table E.2 � Example of calibration data at � .43
Table E.3 � Example of calibration data at � .43
– 4 – 60758 � IEC:2004(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SYNTHETIC QUARTZ CRYSTAL –
SPECIFICATIONS AND GUIDE TO THE USE
FOREWORD
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consensus of opinion on the relevant subjects since each technical committee has representation from all
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members of its technical committees and IEC National Committees for any personal injury, property damage or
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